期刊
SOLAR ENERGY MATERIALS AND SOLAR CELLS
卷 95, 期 5, 页码 1382-1388出版社
ELSEVIER
DOI: 10.1016/j.solmat.2010.12.036
关键词
Organic photovoltaics; Inverted devices; Degradation; PEDOT:PSS; Hole-transport layer
资金
- US Department of Energy [DOE-AC36-08G028308]
- National Renewable Energy Laboratory DOE through the National Center for Photovoltaics
The inverted organic photovoltaic (OPV) device architecture represents an important advancement due to the relative environmental stability of the electron transport layer (ETL) and hole-collecting contact. We investigated the initial and long-term behavior of inverted devices to identify changes taking place at the Ag hole-collecting contact. We show that efficient hole collection can be obtained after modifying the Ag contact by thermal annealing, long-term exposure to ambient atmosphere, or employing a high work function organic hole-transport layer (HTL). We find that whether or not the device employs an organic HTL, degradation of the photocurrent initially follows a simple exponential decay. After prolonged illumination (> 500 h), devices with an organic HTL fail catastrophically due to a precipitous drop in photocurrent. Based on evidence for pinhole-induced degradation observed in photocurrent maps, we propose a nucleation and island growth mechanism and a model for the photocurrent behavior employing a modified Johnson-Mehl-Avrami-Kolmogorov (JMAK) equation. Devices that do not contain an HTL appear to degrade by a mechanism other than pinhole ingress resulting in a more uniform degradation of the photocurrent across the active area. Published by Elsevier B.V.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据