相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Recent progress in high performance and reliable n-type transition metal oxide-based thin film transistors
Jang Yeon Kwon et al.
SEMICONDUCTOR SCIENCE AND TECHNOLOGY (2015)
Photo-modulated thin film transistor based on dynamic charge transfer within quantum-dots-InGaZnO interface
Xiang Liu et al.
APPLIED PHYSICS LETTERS (2014)
Impact of dopant species on the interfacial trap density and mobility in amorphous In-X-Zn-O solution-processed thin-film transistors
Mohammed Benwadih et al.
JOURNAL OF APPLIED PHYSICS (2014)
Performance improvement of oxide thin-film transistors with a two-step-annealing method
Min Li et al.
SOLID-STATE ELECTRONICS (2014)
Effects of growth temperature on performance and stability of zinc oxide thin film transistors fabricated by thermal atomic layer deposition
Sung Woon Cho et al.
THIN SOLID FILMS (2014)
Oxygen Dispersive Diffusion Induced Bias Stress Instability in Thin Active Layer Amorphous In-Ga-Zn-O Thin-Film Transistors
Jaewook Jeong et al.
APPLIED PHYSICS EXPRESS (2013)
High performance thin film transistor with HfSiO x dielectric fabricated at room temperature RF-magnetron sputtering
Dongkyu Cho et al.
ELECTRONIC MATERIALS LETTERS (2013)
Modeling Sub-Threshold Current-Voltage Characteristics in Thin Film Transistors
Sungsik Lee et al.
JOURNAL OF DISPLAY TECHNOLOGY (2013)
Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances
E. Fortunato et al.
ADVANCED MATERIALS (2012)
Oxygen-Dependent Instability and Annealing/Passivation Effects in Amorphous In-Ga-ZnO Thin-Film Transistors
Wei-Tsung Chen et al.
IEEE ELECTRON DEVICE LETTERS (2011)
Effect of Mechanical and Electromechanical Stress on a-ZIO TFTs
Aritra Dey et al.
IEEE ELECTRON DEVICE LETTERS (2010)
Environment-dependent metastability of passivation-free indium zinc oxide thin film transistor after gate bias stress
Po-Tsun Liu et al.
APPLIED PHYSICS LETTERS (2009)
Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors
A. Suresh et al.
APPLIED PHYSICS LETTERS (2008)
Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors
Jeong-Min Lee et al.
APPLIED PHYSICS LETTERS (2008)
First-principles study of migration mechanisms and diffusion of oxygen in zinc oxide
P Erhart et al.
PHYSICAL REVIEW B (2006)
Engineered films for display technologies
WA MacDonald
JOURNAL OF MATERIALS CHEMISTRY (2004)
Properties of RF magnetron sputtered zinc oxide thin films
R Ondo-Ndong et al.
JOURNAL OF CRYSTAL GROWTH (2003)