期刊
SCRIPTA MATERIALIA
卷 59, 期 4, 页码 428-431出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2008.04.025
关键词
aluminizing; Ni-based superalloy; secondary reaction zone (SRZ); crystal orientation; electron back-scattered diffraction
Distribution of the secondary reaction zone (SRZ) on the (100) plane was investigated in the aluminized Ni-based single-crystal superalloy TMS-75. Preferential formation of the SRZ was observed along the {001} < 110 > directions, whereas the SRZ was not formed along the {001) < 100 > directions. This result can be explained by the anisotropy of recrystallization in the single-crystalline substrate. (C) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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