期刊
REVIEW OF SCIENTIFIC INSTRUMENTS
卷 83, 期 10, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.4764772
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资金
- National Science Foundation (NSF) [DMR-1006772]
- Division Of Materials Research
- Direct For Mathematical & Physical Scien [1006772] Funding Source: National Science Foundation
A new x-ray luminescence based spectrometer was developed and installed to examine the scintillation properties of materials while revealing the origins of luminescence and investigating trapping defects. Measurements were performed on a number of undoped and Ce doped yttrium aluminum garnet crystals and various luminescence centers were characterized. The measured x-ray luminescence spectra provide information about the spectral range and the scintillation efficiency and linearity. The efficiency of charge-carriers production due to x ray, their energy transfer to the luminescence centers, and the efficiency of luminescence are all reflected in the efficiency of x-ray luminescence. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4764772]
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