High precision magnetic linear dichroism measurements in (Ga,Mn)As

Investigation of magnetic materials using the first-order magneto-optical Kerr effects (MOKEs) is well established and is frequently used. On the other hand, the utilization of the second-order (or quadratic) magneto-optical (MO) effects for the material research is rather rare. This is due to the small magnitude of quadratic MO signals and the fact that the signals are even in magnetization (i.e., they do not change a sign when the magnetization orientation is reversed), which makes it difficult to separate second-order MO signals from various experimental artifacts. In 2005 a giant quadratic MO effect-magnetic linear dichroism (MLD)-was observed in the ferromagnetic semiconductor (Ga,Mn)As. This discovery not only provided a new experimental tool for the investigation of in-plane magnetization dynamics in (Ga, Mn) As using light at normal incidence, but it also motivated the development of experimental techniques for the measurement of second-order MO effects in general. In this paper we compare four different experimental techniques that can be used to measure MLD and to separate it from experimental artifacts. We show that the most reliable results are obtained when we monitor the polarization of reflected light while the magnetization of the sample is rotated by applying an external magnetic field. Using this technique we measure the MLD spectra of (Ga, Mn) As in a broad spectral range from 0.1 eV to 2.7 eV and we observe that MLD has a magnitude comparable to the polar MOKE signals in this material. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4771922]