期刊
REVIEW OF SCIENTIFIC INSTRUMENTS
卷 82, 期 8, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/1.3626214
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资金
- Scientific User Facilities Division, Office of Basic Energy Sciences, (U.S.) Department of Energy (DOE)
We describe the design and current performance of the backscattering silicon spectrometer (BASIS), a time-of-flight backscattering spectrometer built at the spallation neutron source (SNS) of the Oak Ridge National Laboratory (ORNL). BASIS is the first silicon-based backscattering spectrometer installed at a spallation neutron source. In addition to high intensity, it offers a high-energy resolution of about 3.5 mu eV and a large and variable energy transfer range. These ensure an excellent overlap with the dynamic ranges accessible at other inelastic spectrometers at the SNS. (C) 2011 American Institute of Physics. [doi:10.1063/1.3626214]
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