相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Near-field microwave microscope measurements to characterize bulk material properties
Atif Imtiaz et al.
APPLIED PHYSICS LETTERS (2007)
Subsurface near-field scanning tomography
K. P. Gaikovich
PHYSICAL REVIEW LETTERS (2007)
Effect of tip geometry on contrast and spatial resolution of the near-field microwave microscope
Atif Imtiaz et al.
JOURNAL OF APPLIED PHYSICS (2006)
Noncontact dielectric constant metrology of low-k interconnect films using a near-field scanned microwave probe
Vladimir V. Talanov et al.
APPLIED PHYSICS LETTERS (2006)
A near-field scanned microwave probe for spatially localized electrical metrology
VV Talanov et al.
APPLIED PHYSICS LETTERS (2006)
Electrodynamics of microwave near-field probing: Application to medical diagnostics
AN Reznik et al.
JOURNAL OF APPLIED PHYSICS (2005)
Near-field microwave tomography of biological objects
AN Reznik et al.
TECHNICAL PHYSICS (2004)
Quantitative microwave evanescent microscopy of dielectric thin films using a recursive image charge approach
C Gao et al.
APPLIED PHYSICS LETTERS (2004)
Body-of-revolution FDTD simulations of improved tip performance for scanning near-field optical microscopes
FI Baida et al.
OPTICS COMMUNICATIONS (2003)
Near-field of a scanning aperture microwave probe: A 3-D finite element analysis
M Golosovsky et al.
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT (2002)
High-frequency near-field microscopy
BT Rosner et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2002)
Quantitative analysis of scanning microwave microscopy on dielectric thin film by finite element calculation
JH Lee et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2001)
Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope
DE Steinhauer et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2000)