Measurement of K-shell absorption edge jump factors and jump ratios of some medium Z elements using EDXRF technique

Energy dispersive X-ray fluorescence technique (EDXRF) has been employed for measuring K-shell absorption jump factors and jump ratios in elements Mn, Fe, Co, Cu, Zn, As and Sr using an X-PIPS Si(Li) detector. 900 reflection geometry has been used to detect the emitted fluorescent K X-rays from the target elements excited by 59.54 key gamma-rays emitted from an Am-241 radioactive point source. Measured values of these parameters have been compared with different theoretically calculated as well as with other available experimental values. It is found that the present results fairly agree with theoretically calculated and experimental values within experimental uncertainties. (C) 2010 Elsevier Ltd. All rights reserved.