4.7 Article

Synchrotron-based microprobe investigation of impurities in raw quartz-bearing and carbon-bearing feedstock materials for photovoltaic applications

期刊

PROGRESS IN PHOTOVOLTAICS
卷 20, 期 2, 页码 217-225

出版社

WILEY-BLACKWELL
DOI: 10.1002/pip.1126

关键词

quartz; feedstock; silicon refining; impurities; synchrotron-based microprobe; X-ray fluorescence; XANES; metals

资金

  1. US Department of Energy [DE-FG36-09GO19001]
  2. Doug Spreng
  3. Chesonis Family Foundation
  4. BASIC, Norwegian Research Council [191285/V30]
  5. Claire Boothe Luce Foundation
  6. Office of Science, Office of Basic Energy Sciences, of the US Department of Energy [E-AC02-05CH11231, DE-AC02-06CH11357]

向作者/读者索取更多资源

Using synchrotron-based analytical microprobe techniques, we determine micrometer-scale elemental composition, spatial distribution, and oxidation state of impurities in raw feedstock materials used in the photovoltaic industry. Investigated Si-bearing compounds are pegmatitic quartz, hydrothermal quartz, and quartzite. Micrometer-scale clusters containing Fe, Ti, and/or Ca are frequently observed at structural defects in oxidized states and in bulk concentrations equivalent to inductively coupled plasma mass spectroscopy measurements. Investigated C-bearing compounds are pine wood, pine charcoal, and eucalyptus charcoal. Clustered metals are observed only in the charcoal samples. Impurity clustering implies that industrial processing could be adapted to take advantage of this natural gettering phenomenon, expanding the usable range of raw feedstock materials to dirtier, cheaper, and more abundant ones, currently underexploited for solar-grade silicon production. Copyright (c) 2011 John Wiley & Sons, Ltd.

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