4.8 Article

Goniometer-based femtosecond crystallography with X-ray free electron lasers

出版社

NATL ACAD SCIENCES
DOI: 10.1073/pnas.1418733111

关键词

femtosecond diffraction; crystallography; XFEL; structural biology

资金

  1. US Department of Energy, Office of Basic Energy Sciences
  2. Use of the Stanford Synchrotron Radiation Lightsource (SSRL)
  3. SLAC National Accelerator Laboratory
  4. US Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-76SF00515]
  5. US Department of Energy Office of Biological and Environmental Research
  6. National Institutes of Health (NIH)
  7. National Institute of General Medical Sciences [P41GM103393]
  8. Howard Hughes Medical Institute Collaborative Innovation Award
  9. NIH [GM095887, GM102520, GM073210, GM082250, GM094625]
  10. Biological and Electron Transfer
  11. Catalysis EFRC
  12. US Department of Energy, Office of Science [DE-SC0012518]
  13. U.S. Department of Energy (DOE) [DE-SC0012518] Funding Source: U.S. Department of Energy (DOE)

向作者/读者索取更多资源

The emerging method of femtosecond crystallography (FX) may extend the diffraction resolution accessible from small radiationsensitive crystals and provides a means to determine catalytically accurate structures of acutely radiation-sensitive metalloenzymes. Automated goniometer-based instrumentation developed for use at the Linac Coherent Light Source enabled efficient and flexible FX experiments to be performed on a variety of sample types. In the case of rod-shaped Cpl hydrogenase crystals, only five crystals and about 30 min of beam time were used to obtain the 125 still diffraction patterns used to produce a 1.6-angstrom resolution electron densi map. For smaller crystals, high-density grids were used to increase sample throughput; 930 myoglobin crystals mounted at random orientation inside 32 grids were exposed, demonstrating the utility of this approach. Screening results from cryocooled crystals of beta(2)-adrenoreceptor and an RNA polymerase II complex indicate the potential to extend the diffraction resolution obtainable from very radiation-sensitive samples beyond that possible with undulator-based synchrotron sources.

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