4.7 Article

Magnetoresistive Random Access Memory: The Path to Competitiveness and Scalability

期刊

PROCEEDINGS OF THE IEEE
卷 96, 期 11, 页码 1786-1798

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JPROC.2008.2004313

关键词

Giant magnetoresistance; magnetic random access memory (MRAM); magnetic switching; magnetic tunnel junction; magnetoresistance; nonvolatile memory; spin polarization; spin torque transfer; tunneling magnetoresistance

资金

  1. Office of Naval Research
  2. NSF/MRSEC at Johns Hopkins University

向作者/读者索取更多资源

This paper provides an in-depth review of the magneto resistive random access memory technology and its developments over the past decade. Both the traditional field-driven and more recent spin torque transfer driven designs are discussed. By pointing out key technical challenges, important aspects and characteristics of various designs are used to illustrate mechanisms that overcome the technical obstacles. A significant portion of this paper is devoted to the principles of various designs based on spin torque transfer effect, including memory elements with in-plane and perpendicular magnetic electrodes.

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