期刊
PRAMANA-JOURNAL OF PHYSICS
卷 76, 期 2, 页码 321-329出版社
INDIAN ACAD SCIENCES
DOI: 10.1007/s12043-011-0045-z
关键词
X-ray fluorescence; X-ray spectrometry; quantitative XRF analysis; in situ XRF measurements
This paper reviews the major factors influencing the accuracy of the energy-dispersive X-ray fluorescence (EDXRF) analysis including physical and chemical matrix effects (resulting from particle size, surface irregularity, mineralogy, moisture, absorption and enhancement) as well as the correction procedures with emphasis on the analysis of unprepared samples. Quantification methods for thin samples, samples with intermediate thickness and thick samples are presented including fundamental parameter methods, influence coefficient algorithms, empirical coefficient algorithms and quantification methods based on scattered primary radiation. Quality control procedures are also reviewed.
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