期刊
POWDER DIFFRACTION
卷 29, 期 3, 页码 220-232出版社
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S0885715614000360
关键词
texture analysis; synchrotron diffraction; Rietveld method; shale; diamond anvil cell; ferropericlase
资金
- NSF [EAR-0836402]
- DOE [DE-FG02-05ER15637]
- AYSS JINR [12-401-01]
- Division Of Earth Sciences
- Directorate For Geosciences [1343908] Funding Source: National Science Foundation
Synchrotron X-ray diffraction images are increasingly used to characterize crystallographic preferred orientation distributions (texture) of fine-grained polyphase materials. Diffraction images can be analyzed quantitatively with the Rietveld method as implemented in the software package Materials Analysis Using Diffraction. Here we describe the analysis procedure for diffraction images collected with high energy X-rays for a complex, multiphase shale, and for those collected in situ in diamond anvil cells at high pressure and anisotropic stress. (C) 2014 International Centre for Diffraction Data.
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