期刊
POWDER DIFFRACTION
卷 26, 期 1, 页码 88-93出版社
CAMBRIDGE UNIV PRESS
DOI: 10.1154/1.3548128
关键词
Rietveld; instrument profile; profile function; convolution
GSAS instrument parameters are tabulated for a variety of laboratory and synchrotron diffractometers to give users an idea of the typical ranges of profile parameters when they generate their own instrument parameter files. For modern high-resolution laboratory diffractometers, the parameters fall in the ranges 0<3, V=0, 0<4. 1<3. 0<3, 1<3, and 0
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