期刊
PHYSICAL REVIEW LETTERS
卷 121, 期 13, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.121.135701
关键词
-
资金
- U.S. Department of Energy (DOE), National Nuclear Security Administration (NNSA) [DE-NA0002007]
- DOE/NNSA [DE-NA0002442]
- DOE Office of Science [DE-AC02-06CH11357]
In situ, time-resolved, x-ray diffraction and simultaneous continuum measurements were used to examine structural changes in Si shock compressed to 54 GPa. Shock melting was unambiguously established above similar to 31-33 GPa, through the vanishing of all sharp crystalline diffraction peaks and the emergence of a single broad diffraction ring. Reshock from the melt boundary results in rapid (nanosecond) recrystallization to the hexagonal-close-packed Si phase and further supports melting. Our results also provide new constraints on the high-temperature, high-pressure Si phase diagram.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据