期刊
PHYSICAL REVIEW LETTERS
卷 111, 期 3, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.111.035502
关键词
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资金
- Deutsche Forschungsgemeinschaft (DFG) [SPP 1164, GRK 1276]
- DFG, ESF EUROCORES Programme
Single asperity measurements on Si wafers with variable SiO2 layer thickness, yet identical roughness, revealed the influence of van der Waals (vdW) interactions on friction: on thin (1 nm) SiO2 layers, higher friction and jump-off forces were observed as compared to thick (150 nm) SiO2 layers. The vdW interactions were additionally controlled by a set of silanized Si wafers, exhibiting the same trend. The experimental results demonstrate the influence of the subsurface material and are quantitatively described by combining calculations of interactions of the involved materials and the Derjaguin-Muller-Toporov model.
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