期刊
PHYSICAL REVIEW LETTERS
卷 111, 期 21, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.111.215501
关键词
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资金
- MRSEC (NSF) [DMR-1121262]
- Office of Naval Research [N00014-11-1-0463]
- DOE [DE-AC02-06CH11357, DE-AC02-98CH10886]
- DuPont
- Northwestern University
- Dow
- Division Of Materials Research
- Direct For Mathematical & Physical Scien [1121262] Funding Source: National Science Foundation
Atomic-layer 2D crystals have unique properties that can be significantly modified through interaction with an underlying support. For epitaxial graphene on SiC(0001), the interface strongly influences the electronic properties of the overlaying graphene. We demonstrate a novel combination of x-ray scattering and spectroscopy for studying the complexities of such a buried interface structure. This approach employs x-ray standing wave-excited photoelectron spectroscopy in conjunction with x-ray reflectivity to produce a highly resolved chemically sensitive atomic profile for the terminal substrate bilayers, interface, and graphene layers along the SiC[0001] direction.
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