4.8 Article

Ultralow Doping in Organic Semiconductors: Evidence of Trap Filling

期刊

PHYSICAL REVIEW LETTERS
卷 109, 期 17, 页码 -

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AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.109.176601

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资金

  1. Solvay S. A.
  2. Office of Naval Research [N00014-11-1-0313]
  3. National Science Foundation [DMR-1005892]
  4. German Academic Exchange Service (DAAD)
  5. Direct For Mathematical & Physical Scien
  6. Division Of Materials Research [1005892] Funding Source: National Science Foundation

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Tail states in organic semiconductors have a significant influence on device performances by acting as traps in charge transport. We present a study of the controlled passivation of acceptor tail states in fullerene C-60 by the addition of electrons introduced by molecular n doping. Using ultralow doping, we are able to successively fill the traps with charges and examine the changes in conductivity, activation energy, mobility, and Fermi-level position. Passivation of the traps leads to an increase of the electron mobility in C-60 by more than 3 orders of magnitude, to reach 0.21 cm(2)/(Vs).

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