4.8 Article

Atomic Structure of Highly Strained BiFeO3 Thin Films

期刊

PHYSICAL REVIEW LETTERS
卷 108, 期 4, 页码 -

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AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.108.047601

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资金

  1. Swiss COST office [C10.0089]
  2. Oak Ridge National Laboratory's SHaRE User Facility
  3. Office of Basic Energy Sciences, U.S. Department of Energy
  4. the Office of Basic Energy Sciences, Materials Sciences and Engineering Division, U.S. Department of Energy [DE-FG02-09ER46554]
  5. McMinn Endowment
  6. Office of Science, Office of Basic Energy Sciences of the U.S. Department of Energy [DE-AC02-05CH11231]

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We determine the atomic structure of the pseudotetragonal T phase and the pseudorhombohedral R phase in highly strained multiferroic BiFeO3 thin films by using a combination of atomic-resolution scanning transmission electron microscopy and electron energy-loss spectroscopy. The coordination of the Fe atoms and their displacement relative to the O and Bi positions are assessed by direct imaging. These observations allow us to interpret the electronic structure data derived from electron energy-loss spectroscopy and provide evidence for the giant spontaneous polarization in strained BiFeO3 thin films.

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