4.8 Article

Probing the Out-of-Plane Distortion of Single Point Defects in Atomically Thin Hexagonal Boron Nitride at the Picometer Scale

期刊

PHYSICAL REVIEW LETTERS
卷 106, 期 12, 页码 -

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AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.106.126102

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资金

  1. U.S. DOE [DE-AC02-05CH11231]
  2. Center of Integrated Nanomechanical Systems (COINS) [EEC-0425914]
  3. Office of Science, Office of BES of the U.S. DOE [DE-AC02-05CH11231]
  4. Swiss NSF [PBELP2-123086]
  5. NSF
  6. Swiss National Science Foundation (SNF) [PBELP2-123086] Funding Source: Swiss National Science Foundation (SNF)

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Crystalline systems often lower their energy by atom displacements from regular high-symmetry lattice sites. We demonstrate that such symmetry lowering distortions can be visualized by ultrahigh resolution transmission electron microscopy even at single point defects. Experimental investigation of structural distortions at the monovacancy defects in suspended bilayers of hexagonal boron nitride (h-BN) accompanied by first-principles calculations reveals a characteristic charge-induced pm symmetry configuration of boron vacancies. This symmetry breaking is caused by interlayer bond reconstruction across the bilayer h-BN at the negatively charged boron vacancy defects and results in local membrane bending at the defect site. This study confirms that boron vacancies are dominantly present in the h-BN membrane.

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