期刊
PHYSICAL REVIEW LETTERS
卷 107, 期 22, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.107.223202
关键词
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Using an ultrastable continuous-wave laser at 580 nm we performed spectral hole burning of Eu3+:Y2SiO5 at a very high spectral resolution. The essential parameters determining the usefulness as a macroscopic frequency reference, linewidth, temperature sensitivity, and long-term stability, were characterized using a H-maser stabilized frequency comb. Spectral holes with a linewidth as low as 6 kHz were observed and the upper limit of the drift of the hole frequency was determined to be 5 +/- 3 mHz/s. We discuss the necessary requirements for achieving ultrahigh stability in laser frequency stabilization to these spectral holes.
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