相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Reverse Monte Carlo structural model for a zirconium-based metallic glass incorporating fluctuation microscopy medium-range order data
Jinwoo Hwang et al.
JOURNAL OF MATERIALS RESEARCH (2009)
X-ray cross correlation analysis uncovers hidden local symmetries in disordered matter
Peter Wochner et al.
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA (2009)
Quantifying nanoscale order in amorphous materials: simulating fluctuation electron microscopy of amorphous silicon
Stephanie N. Bogle et al.
JOURNAL OF PHYSICS-CONDENSED MATTER (2007)
The study of nanovolumes of amorphous materials using electron scattering
David J. H. Cockayne
ANNUAL REVIEW OF MATERIALS RESEARCH (2007)
Fluctuation microscopy: a probe of medium range order
MMJ Treacy et al.
REPORTS ON PROGRESS IN PHYSICS (2005)
Experimentally constrained molecular relaxation:: The case of glassy GeSe2 -: art. no. 054204
P Biswas et al.
PHYSICAL REVIEW B (2005)
Increasing medium-range order in amorphous silicon with low-energy ion bombardment
JE Gerbi et al.
APPLIED PHYSICS LETTERS (2003)
Realistic models of paracrystalline silicon
SM Nakhmanson et al.
PHYSICAL REVIEW B (2001)
Shedding light on the growth of amorphous, polymorphous, protocrystalline and microcrystalline silicon thin films
AFI Morral et al.
THIN SOLID FILMS (2001)
High-quality continuous random networks
GT Barkema et al.
PHYSICAL REVIEW B (2000)
Atom pair persistence in disordered materials from fluctuation microscopy
JM Gibson et al.
ULTRAMICROSCOPY (2000)