期刊
PHYSICAL REVIEW LETTERS
卷 100, 期 23, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevLett.100.236104
关键词
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From an interplay of simultaneous Kelvin probe force microscopy and noncontact atomic force microscopy we study atomic-scale variations in the electronic surface potential on TiO(2)(110). Both imaging channels reveal an atomic contrast reflected by the geometry and charged state of the alternating rows of Ti and O surface atoms. From a thorough cross-section analysis we add significant trust to the concept of a local contact potential difference, and determine from this the chemical identity of individual surface species and their role in setting up the local surface potential.
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