Single and double orbital excitations probed by resonant inelastic x-ray scattering

The dispersion of the elusive elementary excitations of orbital ordered systems, orbitons, has escaped detection so far. The recent advances in resonant inelastic x-ray scattering (RIXS) techniques have made it, in principle, a powerful new probe of orbiton dynamics. We compute the detailed traces that orbitons leave in RIXS for an e(g) orbital ordered system, using the ultrashort core-hole lifetime expansion for RIXS. We observe that both single- and double-orbiton excitations are allowed, where the former, at lower energy, have sharper features. The rich energy- and momentum-dependent intensity variations that we observe make clear that RIXS is an ideal method to identify and map out orbiton dispersions.