相关参考文献
注意：仅列出部分参考文献，下载原文获取全部文献信息。Local atomic and electronic structure of the Pb/Si(111) mosaic phase:: STM and ab initio study
Martin Svec et al.
PHYSICAL REVIEW B (2008)
The force needed to move an atom on a surface
Markus Ternes et al.
SCIENCE (2008)
First-principles analysis of the STM image heights of styrene on Si(100)
K. H. Bevan et al.
PHYSICAL REVIEW B (2007)
Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy
Yoshiaki Sugimoto et al.
PHYSICAL REVIEW LETTERS (2007)
Chemical identification of individual surface atoms by atomic force microscopy
Yoshiaki Sugimoto et al.
NATURE (2007)
Controlled contact to a C60 molecule
N. Neel et al.
PHYSICAL REVIEW LETTERS (2007)
Conductance and Kondo effect in a controlled single-atom contact
N. Neel et al.
PHYSICAL REVIEW LETTERS (2007)
Contact formation dynamics: Mapping chemical bond formation between a molecule and a metallic probe
Borislav Naydenov et al.
NANO LETTERS (2006)
Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy:: The case of the α-Sn/Si(111)-(√3x√3)R30° surface
Yoshiaki Sugimoto et al.
PHYSICAL REVIEW B (2006)
Multicenter approach to the exchange-correlation interactions in ab initio tight-binding methods -: art. no. 235101
P Jelínek et al.
PHYSICAL REVIEW B (2005)
Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite
S Hembacher et al.
PHYSICAL REVIEW LETTERS (2005)
First-principles simulations of STM images:: From tunneling to the contact regime -: art. no. 085405
JM Blanco et al.
PHYSICAL REVIEW B (2004)
Observation of electronic states on Si(111)-(7 x 7) through short-range attractive force with noncontact atomic force spectroscopy
T Arai et al.
PHYSICAL REVIEW LETTERS (2004)
Advances in atomic force microscopy
FJ Giessibl
REVIEWS OF MODERN PHYSICS (2003)
Quantum properties of atomic-sized conductors
N Agraït et al.
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS (2003)
Surface relaxations, current enhancements, and absolute distances in high resolution scanning tunneling microscopy -: art. no. 236104
WA Hofer et al.
PHYSICAL REVIEW LETTERS (2001)
Metallic adhesion and tunnelling at the atomic scale
A Schirmeisen et al.
NEW JOURNAL OF PHYSICS (2000)
分享论文
