期刊
PHYSICAL REVIEW B
卷 89, 期 20, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.89.205407
关键词
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资金
- Volkswagen Foundation
- Deutsche Forschungsgemeinschaft [SPP 1243]
- ERC
It has been demonstrated that atomic force microscopy imaging with CO-functionalizedtips provides unprecedented resolution, yet it is subject to strong image distortions. Here we propose a method to correct for these distortions. The lateral force acting on the tip apex is calculated from three-dimensional maps of the frequency shift signal. Assuming a linear relationship between lateral distortion and force, atomic force microscopy images could be deskewed for different substrate systems.
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