期刊
PHYSICAL REVIEW B
卷 85, 期 19, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.85.195449
关键词
-
资金
- Swedish Research Council (VR)
- Swedish Government Agency for Innovation Systems (VINNOVA)
We present a method to reconstruct the nonlinear tip-surface force and extract material properties from a multifrequency atomic force microscopy (AFM) measurement with a high-quality-factor cantilever resonance. In a measurement time of similar to 2 ms, we are able to accurately reconstruct the tip-surface force-displacement curve, allowing simultaneous high-resolution imaging of both topography and material properties at typical AFM scan rates. We verify the method using numerical simulations, apply it to experimental data, and use it to image mechanical properties of a polymer blend. We further discuss the limitations of the method and identify suitable operating conditions for AFM experiments.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据