期刊
PHYSICAL REVIEW B
卷 85, 期 2, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.85.024113
关键词
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资金
- US Army Research Office [W911NF-10-1-0482]
- Samsung Electronics Co., Ltd. [919 Samsung 2010-06795]
- US Department of Energy [DE-FG02-07ER46453, DE-FG02-07ER46471]
We present the temperature- and thickness-dependent structural and morphological evolution of strain-induced transformations in highly strained epitaxial BiFeO3 films deposited on LaAlO3 (001) substrates. Using high-resolution x-ray diffraction and temperature-dependent scanning-probe-based studies, we observe a complex temperature-and thickness-dependent evolution of phases in this system. A thickness-dependent transformation from a single, monoclinically distorted, tetragonal-like phase to a complex mixed-phase structure in films with thicknesses up to similar to 200 nm is the consequence of a strain-induced spinodal instability in the BiFeO3/LaAlO3 system. Additionally, a breakdown of this strain-stabilized metastable mixed-phase structure to nonepitaxial microcrystallites of the parent rhombohedral structure of BiFeO3 is observed to occur at a critical thickness of similar to 300 nm. We further propose a mechanism for this abrupt breakdown that provides insight into the competing nature of the phases in this system.
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