4.6 Article

Vacancy defects in epitaxial thin film CuGaSe2 and CuInSe2

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PHYSICAL REVIEW B
卷 86, 期 6, 页码 -

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AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.86.064102

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  1. Fonds National de la Recherche Luxembourg (FNR)
  2. Polish National Centre for Research and Development (NCBiR)
  3. Academy of Finland

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Epitaxial thin film CuGaSe2 and CuInSe2 samples grown on GaAs substrates with varying [Cu]/[Ga,In] ratios were studied using positron annihilation Doppler-broadening spectroscopy and were compared to bulk crystals. We find both Cu monovacancies and Cu-Se divacancies in CuInSe2, whereas, in CuGaSe2, the only observed vacancy defect is the Cu-Se divacancy.

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