期刊
PHYSICAL REVIEW B
卷 82, 期 15, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.82.155328
关键词
-
资金
- Center for Probing the Nanoscale (CPN),
- NSF NSEC [PHY-0830228, PHY-0425897]
- NSF [ECS-9731293]
- NDSEG
- David and Lucile Packard
- Division Of Physics
- Direct For Mathematical & Physical Scien [830228] Funding Source: National Science Foundation
Using scanning gate microscopy (SGM), we probe the scattering between a beam of electrons and a two-dimensional electron gas (2DEG) as a function of the beam's injection energy, and distance from the injection point. At low injection energies, we find electrons in the beam scatter by small angles, as has been previously observed. At high injection energies, we find a surprising result: placing the SGM tip where it backscatters electrons increases the differential conductance through the system. This effect is explained by a nonequilibrium distribution of electrons in a localized region of 2DEG near the injection point. Our data indicate that the spatial extent of this highly nonequilibrium distribution is within similar to 1 mu m of the injection point. We approximate the nonequilibrium region as having an effective temperature that depends linearly upon injection energy.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据