期刊
PHYSICAL REVIEW B
卷 80, 期 8, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.80.085430
关键词
electron microscopy; graphene; impurities; low energy electron diffraction; materials preparation; scanning tunnelling microscopy
资金
- U. S. DOE [DE-AC04-94AL85000]
We use low-energy electron microscopy (LEEM), low-energy electron diffraction (LEED), and scanning tunneling microscopy (STM) to study different orientations of single-layer graphene sheets on Ir(111). The most-abundant orientation has previously been characterized in the literature. Using selective-area LEED we find three other variants, which are rotated 14 degrees, 18.5 degrees, and 30 degrees with respect to the most common variant. The similar to 30 degrees-rotated structure is also studied by STM. We propose that all four variants are moireacute structures that can be classified using simple geometric rules involving periodic and quasiperiodic structural motifs. In addition, LEEM reveals that linear defects form in the graphene sheets during cooling from the synthesis temperature. STM shows that these defects are ridges, suggesting that the graphene sheets delaminate locally as the Ir substrate contracts.
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