期刊
PHYSICAL REVIEW B
卷 79, 期 10, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.79.104104
关键词
dielectric polarisation; electric domains; ferroelectric thin films; internal stresses; lead compounds; phonons; Raman spectra; soft modes; stress effects
资金
- European network of excellence FAME and EGIDE
A comparative analysis of Raman spectra from polydomain PbTiO3 thin films with both polydomain and single-domain PbTiO3 crystals is presented. The Raman signature of ferroelectric thin films is complex when used for stress analysis. Raman spectroscopy of a stress-free polydomain PbTiO3 single crystal reveals that the profile of phonon modes can be significantly modified by the existence of quasimodes. The different potential origins of quasimodes are discussed, and it is emphasized that quasimodes should be taken into account for an accurate estimation of residual stress values in ferroelectric films via Raman scattering. We finally propose and illustrate that the E(3TO) hard mode is more reliable for the estimation of biaxial residual stress in PbTiO3 than the commonly used E(1TO) soft mode.
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