期刊
PHYSICAL REVIEW B
卷 79, 期 5, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.79.052102
关键词
correlation methods; gallium compounds; image registration; nanoparticles; semiconductor quantum dots; tomography; X-ray diffraction; X-ray microscopy
资金
- U. S. DOE, BES [DE-FG0206ER46276]
- U. S. NSF [DMR-0520894]
- RIKEN
We report the development of a tomographic image alignment method, based on the moment of charge density, for three-dimensional (3D) coherent diffraction microscopy. By using a 3D model system, we demonstrate that the moment of charge density improves the alignment accuracy over the conventional cross-correlation method. Better results are also obtained when we apply this method to the alignment of 27 experimental projections from a GaN-Ga2O3 quantum dot nanoparticle.
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