期刊
PHYSICAL REVIEW B
卷 78, 期 20, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevB.78.205424
关键词
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资金
- National Science Foundation [0404084, 0521041]
- Intel Research
- W. M. Keck Foundation
- DOE Office of Basic Energy Sciences [W-31-109-Eng-38, W-7405-Eng-82]
- Div Of Electrical, Commun & Cyber Sys
- Directorate For Engineering [0404084] Funding Source: National Science Foundation
- Div Of Electrical, Commun & Cyber Sys
- Directorate For Engineering [0521041] Funding Source: National Science Foundation
We present a structural analysis of the graphene-4HSiC(0001) interface using surface x-ray reflectivity. We find that the interface is composed of an extended reconstruction of two SiC bilayers. The interface directly below the first graphene sheet is an extended layer that is more than twice the thickness of a bulk SiC bilayer (similar to 1.7 A compared to 0.63 A). The distance from this interface layer to the first graphene sheet is much smaller than the graphite interlayer spacing but larger than the same distance measured for graphene grown on the (0001) surface, as predicted previously by ab initio calculations.
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