☆ 4.6 Article

Mean free path of inelastic electron scattering in elemental solids and oxides using transmission electron microscopy: Atomic number dependent oscillatory behavior

PHYSICAL REVIEW B (2008)

相关参考文献

注意：仅列出部分参考文献，下载原文获取全部文献信息。

Article Microscopy

Measurement of mean free paths for inelastic electron scattering of Si and SiO2

CW Lee et al.

JOURNAL OF ELECTRON MICROSCOPY (2002)

添加到收藏夹

© Peeref 2019-2024. All rights reserved.