相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Thermodynamic description of the Au-Si-Sn system
F. G. Meng et al.
JOURNAL OF ALLOYS AND COMPOUNDS (2007)
Explosive crystallisation of amorphous germanium in Ge/Al layer systems; comparison with Si/Al layer systems
Z. M. Wang et al.
SCRIPTA MATERIALIA (2006)
Thermodynamic model of oxide overgrowth on bare metals: Relaxation of growth strain by plastic deformation
F. Reichel et al.
PHYSICAL REVIEW B (2006)
Superheating and melting kinetics of confined thin films
L. Zhang et al.
ACTA MATERIALIA (2006)
Calibration of a heating/cooling chamber for X-ray diffraction measurements of mechanical stress and crystallographic texture
M Wohlschlögel et al.
JOURNAL OF APPLIED CRYSTALLOGRAPHY (2006)
Wetting and crystallization at grain boundaries: Origin of aluminum-induced crystallization of amorphous silicon
JY Wang et al.
APPLIED PHYSICS LETTERS (2006)
Direct evidence of nanometric invasionlike grain boundary penetration in the Al/Ga system -: art. no. 215501
E Pereiro-López et al.
PHYSICAL REVIEW LETTERS (2005)
Shape of free and constrained group-IV crystallites: Influence of surface energies
AA Stekolnikov et al.
PHYSICAL REVIEW B (2005)
Premelting at defects within bulk colloidal crystals
AM Alsayed et al.
SCIENCE (2005)
Surface energy, stress and structure of well-relaxed amorphous silicon: A combination approach of ab initio and classical molecular dynamics
S Hara et al.
SURFACE SCIENCE (2005)
The initial stage of the reaction between amorphous silicon and crystalline aluminum
D He et al.
JOURNAL OF APPLIED PHYSICS (2005)
Reaction between amorphous Si and crystalline Al in Al/Si and Si/Al bilayers: microstructural and thermodynamic analysis of layer exchange
D He et al.
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING (2005)
Grain boundary wetting by a solid phase;: microstructural development in a Zn-5 wt% Al alloy
GA López et al.
ACTA MATERIALIA (2004)
Microstructural changes in amorphous Si/crystalline Al thin bilayer films upon annealing
YH Zhao et al.
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING (2004)
A new method for the determination of the diffusion-induced concentration profile and the interdiffusion coefficient for thin film systems by Auger electron spectroscopical sputter depth profiling
JY Wang et al.
JOURNAL OF MATERIALS RESEARCH (2004)
Applicability of the broken-bond rule to the surface energy of the fcc metals
I Galanakis et al.
SURFACE SCIENCE (2002)
Solid-state crystal-to-amorphous transition in metal-metal multilayers and its thermodynamic and atomistic modelling
BX Liu et al.
ADVANCES IN PHYSICS (2001)
Crystallization of amorphous germanium in an Al/a-Ge bilayer film deposited on a SiO2 substrate
F Katsuki et al.
JOURNAL OF APPLIED PHYSICS (2001)
Study of dynamics and mechanism of metal-induced silicon growth
EA Guliants et al.
JOURNAL OF APPLIED PHYSICS (2001)
Thermodynamic stability of amorphous oxide films on metals: Application to aluminum oxide films on aluminum substrates
LPH Jeurgens et al.
PHYSICAL REVIEW B (2000)
Superheating of confined Pb thin films
L Zhang et al.
PHYSICAL REVIEW LETTERS (2000)
Influence of interface and Al structure on layer exchange during aluminum-induced crystallization of amorphous silicon
O Nast et al.
JOURNAL OF APPLIED PHYSICS (2000)
Elucidation of the layer exchange mechanism in the formation of polycrystalline silicon by aluminum-induced crystallization
O Nast et al.
JOURNAL OF APPLIED PHYSICS (2000)