期刊
PHYSICAL CHEMISTRY CHEMICAL PHYSICS
卷 11, 期 37, 页码 8144-8148出版社
ROYAL SOC CHEMISTRY
DOI: 10.1039/b910903j
关键词
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资金
- National Science Foundation [DMR-0604004]
Small polaron carrier density in epitaxial, doped CeO2 thin films under low oxygen partial pressure was determined from electrochemically-measured capacitance after accounting for interfacial effects and shown to agree well with bulk values.
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