Temperature dependence of the Raman spectra of Bi2Te3 and Bi0.5Sb1.5Te3 thermoelectric films

The temperature dependence of the Raman spectra of Bi2Te3 and Bi0.5Sb1.5Te3 thermoelectric films was investigated. The temperature coefficients of the Eg(2) peak positions were determined as 0.0137 cm1/degrees C and 0.0156 cm1/degrees C, respectively. The thermal expansion of the crystal caused a linear shift of the Raman peak induced by the temperature change. Based on the linear relation, a reliable and noninvasive micro-Raman scattering method was shown to measure the thermal conductivity of the thermoelectric films. ((c) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)