期刊
ULTRAMICROSCOPY
卷 151, 期 -, 页码 46-55出版社
ELSEVIER
DOI: 10.1016/j.ultramic.2014.10.015
关键词
High-resolution scanning transmission electron microscopy (HR STEM); Electron microscope design and characterisation; Data processing/image processing; Quantitative ADF STEM
类别
资金
- Research Foundation Flanders (FWO, Belgium) [G.0393.11, G.0374.13]
- European Union [312483]
In the present paper, the principles of detection theory are used to quantify the probability of error for atom-counting from high resolution scanning transmission electron microscopy (HR STEM) images. Binary and multiple hypothesis testing have been investigated in order to determine the limits to the precision with which the number of atoms in a projected atomic column can be estimated. The probability of error has been calculated when using STEM images, scattering cross-sections or peak intensities as a criterion to count atoms. Based on this analysis, we conclude that scattering cross-sections perform almost equally well as images and perform better than peak intensities. Furthermore, the optimal STEM detector design can be derived for atom-counting using the expression for the probability of error. We show that for very thin objects LAADF is optimal and that for thicker objects the optimal inner detector angle increases. (C) 2014 Elsevier B.V. All rights reserved
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据