期刊
ULTRAMICROSCOPY
卷 155, 期 -, 页码 1-10出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2015.03.015
关键词
Diffraction imaging; Nanodiffraction; Dark field scanning; Precipitates; Large data; Virtual microscopy
类别
资金
- Austrian Science Fund (FWF) [J3397]
- Molecular Foundry, Lawrence Berkeley National Laboratory
- U.S. Department of Energy [DE-AC02-05CH11231]
- Austrian Science Fund (FWF) [J 3397] Funding Source: researchfish
Two methods on how to obtain the full diffraction information from a sample region and the associated reconstruction of images or diffraction patterns using virtual apertures are demonstrated. In a STEMbased approach, diffraction patterns are recorded for each beam position using a small probe convergence angle. Similarly, a tilt series of TEM dark-field images is acquired. The resulting datasets allow the reconstruction of either electron diffraction patterns, or bright-, dark- or annular dark-field images using virtual apertures. The experimental procedures of both methods are presented in the paper and are applied to a precipitation strengthened and creep deformed ferritic alloy with a complex microstructure. The reconstructed virtual images are compared with conventional TEM images. The major advantage is that arbitrarily shaped virtual apertures generated with image processing software can be designed without facing any physical limitations. In addition, any virtual detector that is specifically designed according to the underlying crystal structure can be created to optimize image contrast. (C) 2015 Elsevier B.V. All rights reserved
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