4.5 Article

Background, status and future of the Transmission Electron Aberration-corrected Microscope project

相关参考文献

注意:仅列出部分参考文献,下载原文获取全部文献信息。
Article Instruments & Instrumentation

A rad-hard CMOS active pixel sensor for electron microscopy

Marco Battaglia et al.

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT (2009)

Article Materials Science, Multidisciplinary

Spatial resolution and information transfer in scanning transmission electron microscopy

Yiping Peng et al.

MICROSCOPY AND MICROANALYSIS (2008)

Article Chemistry, Multidisciplinary

Direct Imaging of Lattice Atoms and Topological Defects in Graphene Membranes

Jannik C. Meyer et al.

NANO LETTERS (2008)

Article Multidisciplinary Sciences

Imaging and dynamics of light atoms and molecules on graphene

Jannik C. Meyer et al.

NATURE (2008)

Article Multidisciplinary Sciences

Bipolar supercurrent in graphene

Hubert B. Heersche et al.

NATURE (2007)

Article Materials Science, Multidisciplinary

Advancing the hexapole Cs-corrector for the scanning transmission electron microscope

Heiko Mueller et al.

MICROSCOPY AND MICROANALYSIS (2006)

Article Multidisciplinary Sciences

Half-metallic graphene nanoribbons

Young-Woo Son et al.

NATURE (2006)

Article Multidisciplinary Sciences

Depth sectioning with the aberration-corrected scanning transmission electron microscope

AY Borisevich et al.

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA (2006)

Article Chemistry, Physical

Atomic resolution of lithium ions in LiCoO2

Y Shao-Horn et al.

NATURE MATERIALS (2003)