4.5 Article

A new framework for feature descriptor based on SIFT

期刊

PATTERN RECOGNITION LETTERS
卷 30, 期 5, 页码 544-557

出版社

ELSEVIER
DOI: 10.1016/j.patrec.2008.12.004

关键词

Feature descriptor; SIFT; Distinctiveness; Invariance; Elliptical neighboring region; Log-polar histogram

资金

  1. National Basic Research Program of China [2006CB303105]
  2. National High Technology Research and Development Program of China [2009AA01Z334]
  3. Natural Science Foundation of China [60873136]

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The description of interest points is a critical aspect of point correspondence which is vital in some computer vision and pattern recognition tasks. SIFT descriptor has been proven to perform better on the distinctiveness and robustness than other local descriptors. But SIFT descriptor does not involve color and global information of feature point which provides powerfully distinguishable signals in feature description and matching tasks. so many mismatches may occur. This paper improves SIFT descriptor, and presents a new framework for feature descriptor based on SIFT by integrating color and global information with it. The proposed framework consists of the improved SIFT, color invariance components and global component. We use a log-polar histogram to build three color invariance components and the global component of the proposed framework, respectively. In addition, the elliptical neighboring region for every interest point is used so as to make the framework fully invariant to common affine transformations. Experimental comparison with three related feature descriptors is carried out in two groups of experiments, validating the proposed framework. (c) 2008 Elsevier B.V. All rights reserved.

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