期刊
ORGANIC ELECTRONICS
卷 11, 期 1, 页码 164-168出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.orgel.2009.09.022
关键词
OLED; Metal-organic interface; Metal diffusion; LiF; Alq(3); Al; Ion scattering; MEIS
资金
- Korea Research Council of Fundamental Science and Technology (KRCF) through the KRISS project of Development of Advanced Industrial Metrology
- Korea Research Foundation [2009-0070876]
The interface between Al and tris-(8-hydroquinoline) aluminum (Alq(3)) was studied using in situ medium energy ion scattering spectroscopy. We compared two interfaces of Al/LiF/Alq(3) and Al/Alq(3) with the elemental depth profile of each interface. The thin LiF changes the interfacial structures significantly: the excess Li in the LiF layer diffuses into Alq(3) while F does not. In addition, the Al diffusion into the Alq(3) layer during the initial stages of Al deposition is reduced significantly compared to the interface without the LiF interlayer. The LiF interlayer makes a more abrupt metal-organic interface, which would contribute to the efficiency and stability of the organic light-emitting device. (c) 2009 Elsevier B.V. All rights reserved.
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