期刊
OPTICS LETTERS
卷 36, 期 22, 页码 4362-4364出版社
OPTICAL SOC AMER
DOI: 10.1364/OL.36.004362
关键词
-
类别
资金
- Deutsche Forschungsgemeinschaft (DFG) [OS 111/19-2]
- Department of Science and Technology
- University Grants Commission, Government of India
- Department of Science and Technology, Government of India
- Alexander von Humboldt Foundation
High-resolution three-dimensional (3D) microscopic imaging requires the use of short wavelengths. Quantitative 3D imaging techniques, such as digital holographic microscopy, require interference between the object beam and a known reference background for the extraction of phase information. At shorter wavelengths, due to short coherence lengths, it may be difficult to implement a two-beam off-axis setup. Thus, a single-beam technique, which provides complete phase information, may be better suited for short wavelengths. This Letter describes the development of a quantitative microscopy technique at 193nm using multiple intensity samplings and phase retrieval. (C) 2011 Optical Society of America
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据