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High-resolution quantitative phase microscopic imaging in deep UV with phase retrieval

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OPTICS LETTERS
卷 36, 期 22, 页码 4362-4364

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OPTICAL SOC AMER
DOI: 10.1364/OL.36.004362

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  1. Deutsche Forschungsgemeinschaft (DFG) [OS 111/19-2]
  2. Department of Science and Technology
  3. University Grants Commission, Government of India
  4. Department of Science and Technology, Government of India
  5. Alexander von Humboldt Foundation

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High-resolution three-dimensional (3D) microscopic imaging requires the use of short wavelengths. Quantitative 3D imaging techniques, such as digital holographic microscopy, require interference between the object beam and a known reference background for the extraction of phase information. At shorter wavelengths, due to short coherence lengths, it may be difficult to implement a two-beam off-axis setup. Thus, a single-beam technique, which provides complete phase information, may be better suited for short wavelengths. This Letter describes the development of a quantitative microscopy technique at 193nm using multiple intensity samplings and phase retrieval. (C) 2011 Optical Society of America

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