期刊
OPTICS EXPRESS
卷 18, 期 8, 页码 7724-7731出版社
OPTICAL SOC AMER
DOI: 10.1364/OE.18.007724
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资金
- OPERA Korea Science and Engineering Foundation [R01-2007-000-21036-0, K20815000003]
- WCU [R31-2008-000-10071-0]
- Ministry of Education, Science & Technology (MoST), Republic of Korea [R31-2008-000-10071-0] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
- National Research Foundation of Korea [2008-00580, R01-2007-000-21036-0, 2007-0057016] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
Single-phase, polycrystalline ErxY2-xSiO5 thin films were deposited by reactive ion-beam sputter deposition and rapid thermal annealing. Due to the crystalline nature, the silicate thin films provide peak Er3+ emission cross-section of 0.9 +/- 0.02 x 10(-20) cm(2) that is higher than that in silica. Optical gain, with near 60% inversion, is achieved via optical pumping of a single-mode, ridge-type waveguide with the silicate core with an Er concentration of 1.7 x 10(20) cm(-3). Analysis of pump-power dependence of the optical gain and spontaneous emission intensity of Er3+ indicate that the gain is limited by cooperative upconversion process, whose coefficient is determined to be (8 +/- 3) x 10(-17) cm(3)/sec. (C) 2010 Optical Society of America
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