期刊
OPTICS EXPRESS
卷 18, 期 15, 页码 15998-16004出版社
OPTICAL SOC AMER
DOI: 10.1364/OE.18.015998
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- SPARX
- PRIN [2007ZT39FN_003]
We report the performance of an X-ray phase contrast microscope for laboratory sources with 300 nm spatial resolution. The microscope is based on a commercial X-ray microfocus source equipped with a planar X-ray waveguide able to produce a sub-micrometer x-ray beam in one dimension. Phase contrast images of representative samples are reported. The achieved contrast and resolution is discussed for different configurations. The proposed approach could represent a simple, inexpensive, solution for sub-micrometer resolution imaging with small laboratory setups. (C) 2010 Optical Society of America
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