期刊
OPTICS EXPRESS
卷 17, 期 1, 页码 208-217出版社
OPTICAL SOC AMER
DOI: 10.1364/OE.17.000208
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资金
- Czech Ministry of Education [LC510, LC528]
- INGO [LA08024]
- Academy of Sciences of the Czech Republic [Z10100523, IAA400100701, KAN300100702]
- Czech Science Foundation [202/08/H057]
- State Committee for Scientific Research of the Republic of Poland [72/E-67/SPB/5.PR, UE/DZ 27/2003-2005]
- Swedish Research Foundation
- European Commission [FP6, 012843, 211737]
- European High Power Laser Energy Research Facility [G1MA-CI-2002-4017]
- CEPHEUS [LOA001036]
- LASERLAB
- U.S. Department of Energy [DE-AC5207NA27344]
- [RII3-CT-2004-506008]
We report the first observation of single-shot soft x-ray laser induced desorption occurring below the ablation threshold in a thin layer of poly ( methyl methacrylate) - PMMA. Irradiated by the focused beam from the Free-electron LASer in Hamburg ( FLASH) at 21.7nm, the samples have been investigated by atomic-force microscope (AFM) enabling the visualization of mild surface modifications caused by the desorption. A model describing non-thermal desorption and ablation has been developed and used to analyze single-shot imprints in PMMA. An intermediate regime of materials removal has been found, confirming model predictions. We also report below-threshold multiple-shot desorption of PMMA induced by high-order harmonics (HOH) at 32nm. Short-time exposure imprints provide sufficient information about transverse beam profile in HOH's tight focus whereas long-time exposed PMMA exhibits radiation-initiated surface hardening making the beam profile measurement infeasible. (C) 2008 Optical Society of America
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