期刊
OPTICS EXPRESS
卷 16, 期 26, 页码 22105-22112出版社
OPTICAL SOC AMER
DOI: 10.1364/OE.16.022105
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- Indiana Economic Development Corporation through the Purdue Research Foundation
We introduce spinning-disc Picometrology which is designed to measure complex refractive index of ultra-thin and size-limited sample deposited on a solid surface. Picometrology is applied to measure the refractive index of graphene on thermal oxide on silicon. The refractive index varies from (n) over tilde (g) = 2.4-1.0i at 532 nm to (n) over tilde (g) = 3.0-1.4i at 633 nm at room temperature. The dispersion is five times stronger than bulk graphite (2.67-1.34i to 2.73-1.42i from 532 nm to 633 nm). (C) 2008 Optical Society of America
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