期刊
OPTICS COMMUNICATIONS
卷 285, 期 6, 页码 1215-1220出版社
ELSEVIER SCIENCE BV
DOI: 10.1016/j.optcom.2011.10.062
关键词
CuxZn1-xS; SILAR; Refractive index; Dielectric constant
类别
CuxZn1-xS (x=0, 025, 0.50, 0.75, 1) thin films were deposited on glass substrates using Successive Ionic Layer Adsorption and Reaction (SILAR) method at room temperature and ambient pressure. The copper concentration (x) effect on the structural, morphological and optical properties of CuxZn1-xS thin films was investigated. The X-ray diffraction (XRD) and scanning electron microscopy (SEM) studies showed that all the films exhibit polycrystalline nature and are covered well with glass substrates. The crystalline and surface properties of the films improved with increasing copper concentration. The energy bandgap values were changed from 2.07 to 3.67 eV depending on the copper concentration. The refractive index (n), optical static and high frequency dielectric constants (epsilon(0), epsilon(infinity)) values were calculated by using the energy bandgap values as a function of the copper concentration. (C) 2011 Elsevier B.V. All rights reserved.
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