期刊
OPTICS COMMUNICATIONS
卷 285, 期 6, 页码 1221-1224出版社
ELSEVIER
DOI: 10.1016/j.optcom.2011.11.031
关键词
InSe thin films; Thermal evaporation; Optical properties
类别
Thin films of InSe were prepared by thermal evaporation technique. The as-deposited films have nano-scale crystalline nature and the annealing enhanced the degree of crystallinity. The optical properties of nanocrystalline thin films of InSe were studied using spectrophotometric measurements of transmittance, T, and reflectance, R, at normal incidence of light in the wavelength range 200-2500 nm. The optical constants (refractive index, n, and absorption index, k) were calculated using a computer program based on Murmann's exact equations. The calculated optical constants are independent of the film thickness. The optical dispersion parameters have been analysed by single oscillator model. The type of transition in InSe films is indirect allowed with a value of energy gap equals to 1.10 eV, which increased to 1.23 eV upon annealing. (C) 2011 Elsevier B.V. All rights reserved.
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